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IC Test Socket 0.65mm Gold-Plated Programming Adapter

Original price was: $89.94.Current price is: $44.97.

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SKU: 1552870045854365594 Category:

Description

Built for dependable chip testing without frustrating connection issues, this TSSOP20 test socket delivers stable, repeatable contact for electronics work. Designed for engineers, technicians, repair professionals, and developers, it supports TSSOP20SSOP20 integrated circuits with a precise 0.65mm lead pitch. Goldplated berylliumcopper contacts provide low contact impedance and reliable electrical performance, while dualcontact technology helps maintain a secure connection. Durable PEIPPS insulation and a flameretardant molded housing make this IC programming adapter well suited to frequent testing and programming tasks. Its specified service life reaches up to 20,000 cycles, with an operating range of 65C to 155C. Key Features 0.65mm test socket design accommodates compatible 4.4mmwide IC packages. Dualcontact, goldplated berylliumcopper contacts enhance connection stability and keep contact impedance below 25 milliohms. Highfrequency design supports reliable IC testing and programming. Flameretardant PEIPPS construction combines strength, heat resistance, and long service life. Why Choose Our SSOP20 IC Test Socket 0.65mm GoldPlated Programming Adapter Unlike basic adapters that can suffer from inconsistent contact, this socket combines dualcontact technology with thick gold plating for dependable connectivity. Its durable engineeringplastic housing and resilient berylliumcopper contacts are designed for repeated professional use, helping reduce unnecessary socket replacements. Perfect For IC programming and functional testing Electronics development and prototyping Chip troubleshooting and repair Engineering labs and production testing Compatible TSSOP20SSOP20 IC applications Make Every Connection Count Upgrade your testing setup with a durable, precise socket designed for stable contact and repeatable performance. Order yours today and make IC programming and testing more dependable.

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